(질문) smartctl에서 에러난 하드를 partimage로 카피해도 되나요?

OS가 설치된 hdd 소리가 수상하여 smartctl 을 해보니, 아래와 같은 에러 메세지가 잡히네요.
뭔 문제인지는 잘 모르겠지만(심각한건가요?), 암튼 partimage를 이용해서 새 하드로 그대로 옮겨서 고 놈을 그대로 사용하고 싶은데요, 그렇게 해도 문제가 되지 않을까요?

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smartctl version 5.38 [x86_64-redhat-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model: WDC WD10EACS-00ZJB0
Firmware Version: 01.01B01
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Nov 22 11:25:37 2009 KST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (26400) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 232 185 021 Pre-fail Always - 5358
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 80
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 051 Old_age Always - 0
9 Power_On_Hours 0x0032 091 090 000 Old_age Always - 7165
10 Spin_Retry_Count 0x0012 100 253 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 78
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 775
193 Load_Cycle_Count 0x0032 079 079 000 Old_age Always - 363616
194 Temperature_Celsius 0x0022 112 106 000 Old_age Always - 40
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 051 Old_age Offline - 0

SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 12 occurred at disk power-on lifetime: 7103 hours (295 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 e0 Error: ABRT 1 sectors at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 00 00 00 00 08 00:01:14.142 READ DMA EXT
f5 00 00 00 00 00 00 08 00:01:14.132 SECURITY FREEZE LOCK
b0 da 00 00 4f c2 00 08 00:01:13.423 SMART RETURN STATUS
b0 d2 00 00 4f c2 00 08 00:01:13.423 SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
b0 d8 00 00 4f c2 00 08 00:01:12.901 SMART ENABLE OPERATIONS

Error 11 occurred at disk power-on lifetime: 7103 hours (295 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 e0 Error: ABRT 1 sectors at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 00 00 00 00 08 00:00:15.928 READ DMA EXT
f5 00 00 00 00 00 00 08 00:00:15.918 SECURITY FREEZE LOCK
b0 da 00 00 4f c2 00 08 00:00:15.098 SMART RETURN STATUS
b0 d2 00 00 4f c2 00 08 00:00:15.098 SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
b0 d8 00 00 4f c2 00 08 00:00:14.497 SMART ENABLE OPERATIONS

Error 10 occurred at disk power-on lifetime: 7103 hours (295 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 e0 Error: ABRT 1 sectors at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 00 00 00 00 08 00:03:06.918 READ DMA EXT
f5 00 00 00 00 00 00 08 00:03:06.908 SECURITY FREEZE LOCK
b0 da 00 00 4f c2 00 08 00:03:04.337 SMART RETURN STATUS
b0 d2 00 00 4f c2 00 08 00:03:04.314 SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
b0 d8 00 00 4f c2 00 08 00:03:01.897 SMART ENABLE OPERATIONS

Error 9 occurred at disk power-on lifetime: 7103 hours (295 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 e0 Error: ABRT 1 sectors at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 00 00 00 00 08 00:00:15.317 READ DMA EXT
f5 00 00 00 00 00 00 08 00:00:15.307 SECURITY FREEZE LOCK
b0 da 00 00 4f c2 00 08 00:00:14.442 SMART RETURN STATUS
b0 d2 00 00 4f c2 00 08 00:00:14.442 SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
b0 d8 00 00 4f c2 00 08 00:00:13.895 SMART ENABLE OPERATIONS

Error 8 occurred at disk power-on lifetime: 7103 hours (295 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 e1 53 4f c2 e0 Device Fault; Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d8 00 00 4f c2 00 08 00:03:56.527 SMART ENABLE OPERATIONS
91 00 3f 00 00 00 0f 08 00:03:56.527 INITIALIZE DEVICE PARAMETERS [OBS-6]
c6 00 01 00 00 00 00 08 00:03:55.324 SET MULTIPLE MODE
91 00 3f 00 00 00 0f 08 00:03:55.324 INITIALIZE DEVICE PARAMETERS [OBS-6]
ef 03 46 00 00 00 00 00 00:03:37.667 SET FEATURES [Set transfer mode]

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

p.s. "hdd 사망", "백업 안하다가 새됐어요"..란 상황 안생기도록 도움 좀 주세요~~